Beamline X22A

General Information

RING: X-RAY
STATUS: Operational
RESEARCH PROGRAM: In-plane diffraction and reflectivity studies of surfaces under electrochemical conditions, also of thin films and multilayers.
LOCAL CONTACT: John Hill
SPOKESPERSON: Ben Ocko

Schedules

• Winter 2004 (Jan.-Apr.)
• Fall 2003 (Sept.-Nov.)
• Older schedules

Capabilities

Energy Range	Crystal Type	Resolution (deltaE/E)	Flux (photons/sec)	Spot Size (mm)	Total Horizontal Angular Acceptance (mradians)
10 keV (+-500 eV)	Si(111)				2.1

Optical Configuration

Mirror:

Platinum coated flat mirror focussing in the vertical. Located 7.9 meters from the source.

Monochromator:

Sagitally focussing Si(111) crystal monochromator scattering in the horizontal. Located at 12.4m from the source.

Sample Position:Located at 14.56m from the source

Beamline Equipment

Computer:

PC/AT Compatable, Linux OS

Beam Line Controls:

VME and GPIB

SPEC control software (by Certified Scientific Software)

Spectrometer:

Huber 6-circle, vertical scattering